- Test Stimulus Environment
Nextas' independently developed test stimulus chamber series covers pressure, inertial, tri-temp IC and other physical test requirements. All chambers feature modular design, flexible docking with NHS-410 series and RHS series handlers, supporting full-scenario applications from lab sampling to high-volume production.
- Application
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MEMS Pressure Sensor
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MEMS Temperature Sensor
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MEMS Gyroscope / Accelerometer Sensor
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Storage Chip
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Power Chip
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MCU semiconductor
- Related Products
MTS320A Memory/MCU Tri-Temp Test System
MTS320A
Memory/MCU Tri-Temp Test System
RTS1000 Inertial Sensor Calibration and Test System
RTS1000
Inertial Sensor Calibration and Test System
RTS1000-M Manual Inertial Sensor Calibration and Test System
RTS1000-M
Manual Inertial Sensor Calibration and Test System
TPSS310-M Manual Pressure Sensor Calibration and Test System
TPSS310-M
Manual Pressure Sensor Calibration and Test System
TPSS310 Pressure Sensor Calibration and Test System
TPSS310
Pressure Sensor Calibration and Test System
MTS320A Memory/MCU Tri-Temp Test System
FUNCTION
FEATURE
- Temperature range -55℃ to 150℃.
- Dual-carrier shuttle structure, pre-soak and test operations run in parallel for higher throughput.
- Up to 512-site parallel test.
- Motorized plunger with quick-change design, pneumatic quick-clamp docking with ATE.
- Compatible with BGA, QFP, TSOP, LGA, SOP and other mainstream package types.
APPLICATION
Nor Flash, NAND Flash, MCU tri-temp test
