- Test Stimulus Environment
Nextas' independently developed test stimulus chamber series covers pressure, inertial, tri-temp IC and other physical test requirements. All chambers feature modular design, flexible docking with NHS-410 series and RHS series handlers, supporting full-scenario applications from lab sampling to high-volume production.
- Application
-
MEMS Pressure Sensor
-
MEMS Temperature Sensor
-
MEMS Gyroscope / Accelerometer Sensor
-
Storage Chip
-
Power Chip
-
MCU semiconductor
- Related Products
MTS320A Memory/MCU Tri-Temp Test System
MTS320A
Memory/MCU Tri-Temp Test System
RTS1000 Inertial Sensor Calibration and Test System
RTS1000
Inertial Sensor Calibration and Test System
RTS1000-M Manual Inertial Sensor Calibration and Test System
RTS1000-M
Manual Inertial Sensor Calibration and Test System
TPSS310-M Manual Pressure Sensor Calibration and Test System
TPSS310-M
Manual Pressure Sensor Calibration and Test System
TPSS310 Pressure Sensor Calibration and Test System
TPSS310
Pressure Sensor Calibration and Test System
RTS1000-M Manual Inertial Sensor Calibration and Test System
FUNCTION
FEATURE
- Rotation range: outer axis -90° to +450°, inner axis -180° to +180°.
- Temperature range -55℃ to 150℃, independent temperature control module, precise and stable.
- Modular design, quick changeover, suitable for multi-product production.
- Supports manual operation mode for full-flow device testing.
- Ideal for lab sampling and small-batch testing.
APPLICATION
3-axis accelerometer, 3-axis gyroscope, 6-axis IMU tri-temp calibration and test
