- Pick-and-Place Handler
Nextas' independently developed pick-and-place handler series serves as a universal platform for semiconductor test handling systems. Configurable with MTS320, TPSS310, RTS series and other test modules, covering Memory/MCU IC, MEMS pressure sensor, and MEMS inertial sensor FT test handling. Supports various input media. Supports MES/SECS-GEM, compatible with mainstream ATE systems.
- Application
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MEMS Pressure Sensor
-
MEMS Temperature Sensor
-
MEMS Gyroscope / Accelerometer Sensor
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Storage Chip
-
Power Chip
-
MCU semiconductor
- Related Products
RHS-430 Test & Tape & Reel Handler
RHS-430
Test & Tape & Reel Handler
NHS-410 High-Speed Pick-and-Place Handler
NHS-410
High-Speed Pick-and-Place Handler
NHS-410 High-Speed Pick-and-Place Handler
FUNCTION
FEATURE
- UPH > 40,000 @ 0s test time, 512-site parallel test.
- JEDEC tray input/output.
- Overall jam rate < 1/10,000, stable and reliable operation.
- Multi-camera high-speed flying vision with deep learning, high-speed precision image processing.
- Matrix nozzle with 64 independently controlled nozzles
- Compatible with various complex test environments.
- Fully compatible with mainstream ATE systems.
- Supports MES and SECS-GEM protocol, seamless smart factory integration.
APPLICATION
Memory/MCU tri-temp test handling, MEMS pressure sensor test handling, MEMS inertial sensor test handling
