- Inertial Sensor Test Handler System
High-precision dual-axis rotating test chamber designed for MEMS inertial sensor batch calibration and test. Dual axes support independent or coordinated control, wide rate range, high operational stability, capable of simulating various motion excitation conditions. Compatible with -55℃ to 150℃ high-low temperature environment, meeting full temperature range calibration and test requirements for consumer, industrial, and automotive-grade MEMS devices.
- Application
-
MEMS Gyroscope / Accelerometer Sensor
- Related Products
RTS1000-M Manual Tri-Temp Inertial Sensor Calibration and Test System
RTS1000-M
Manual Tri-Temp Inertial Sensor Calibration and Test System
RTS1000 Inertial Sensor Calibration and Test System
RTS1000
Inertial Sensor Calibration and Test System
NHS-410 High-Speed Pick-and-Place Handler
NHS-410
High-Speed Pick-and-Place Handler
NHS-410 High-Speed Pick-and-Place Handler
FUNCTION
FEATURE
- UPH > 40,000 @ 0s test time, 512-site parallel test.
- Overall jam rate < 1/10,000, stable and reliable operation.
- Multi-camera high-speed flying vision with deep learning, high-speed precision image processing.
- Matrix nozzle with 64 independently controlled nozzles.
- Compatible with various complex test environments.
- Fully compatible with mainstream ATE systems.
- Supports MES and SECS-GEM protocol, seamless smart factory integration.
APPLICATION
MEMS inertial sensor test handling, Memory/MCU tri-temp test handling, MEMS pressure sensor test handling
